Concurrent Design provides Custom Machine Design for any Inspection and Test requirements as may be required for manufactured products. This includes all manner of metrology; gauging; automated optical inspection (AOI); structural testing for deflection or stress; electrical testing; of components, subsystems or system level products; thermal testing; fluid dynamics - flow bench testing; environmental testing, and life testing. From conceptual design and complete system level engineering through packaging design for your intellectual property, Concurrent Design can provide the solution for your Inspection and Test requirements.
Areas of Expertise
• Metrology - Tolerance Analysis
• Inspection Gauges - Go / NoGo Gauges
• Automated Optical Inspection (AOI)
• Vision Systems
• Structural Testing - Deflection / Stress
• Wafer Level - Known Good Die (KGD) and Thin Film Test
• Wafer Level - Holographic High Aspect Ratio Inspection (HARI)
• Module Level - Single Chip (SCM) and Multi Chip Module (MCM) Burn-in
• Module Level - Thermal Test Chambers
• Module Level - Automated Robotic Test and Sort
• Board Level - In-Circuit Test
• Board Level - Functional Test
• Board Level - Thermal Test Chambers
• Board Level - Visual Inspection Tools
• Board Level - Automated Optical Inspection (AOI)
• Pneumatic and Vacuum "Bed of Nails" Testers
• Environmental Test Chambers
• Fluid Dynamics - Flow Bench Test Equipment
• Life Cycle Test Equipment
• Robotic Exercise Tools
• Manufacturing - Quality Control
Manufacturing Industries of Note
• General Manufacturing
• Industrial Equipment
• Commercial Products
• Semiconductor Capital Equipment
• Nanotechnology Capital Equipment
• Computer Electronics
• Telecommunications
• Medical Equipment
• Clean Energy
Representative Customer Listing
• HelioVolt
• Accretech USA
• IBM |
Current Density / Voltage and Quantum Efficiency Test Equipment for the end-of-line testing of Solar Cells
Client: Heliovolt Corporation
Radio Frequency Test and Burn-in Rack
Client: Symtx / Raytheon |
